Event Overview:

The AAO-HNSF Annual Meeting & OTO Experience is the premier education and networking event for the otolaryngology-head and neck surgery community. Held each fall, the AAO-HNSF Annual Meeting & OTO Experience provides an opportunity for thousands of Academy members, non-member physicians, allied health professionals, administrators, and exhibiting companies to converge for an exhilarating four days.  It draws more than 5,000 medical experts and professionals from around the world and features Expert Series, Panel Presentations, Masters of Surgery Video Presentations, Internatonal Symposium, Scientific Oral Presentations, Honorary Guest Lectures, and numerous Scientific Posters.

Who Should Attend?

The Annual Meeting & OTO EXPO has been designed for practicing otolaryngologist–head and neck surgeons and associates, researchers in otolaryngology, non-physician clinicians, senior academic professors and department chairs, community practitioners, international societies, fellows-in-training, and residents.

Exhibitor Information:

While our Annual Meeting attracts an average of over 5,000 surgeons, physicians and other medical professionals, the AAO-HNS/F also offers many opportunities and resources to network with our approximately 12,000 members year-round. The OTO Experience is now 365, allowing you to reach out to the otolarynogology-head and neck surgeon community via multiple channels every day.

About AAO-HNS:

The AAO-HNS is the world's largest organization representing specialists who treat the ear, nose, throat, and related structures of the head and neck. The Academy represents approximately 12,000 otolaryngologist—head and neck surgeons who diagnose and treat disorders of those areas. The medical disorders treated by our physicians are among the most common that afflict all Americans, young and old. They include chronic ear infection, sinusitis, snoring and sleep apnea, hearing loss, allergies and hay fever, swallowing disorders, nosebleeds, hoarseness, dizziness, and head and neck cancer.